SMMS-Spatially Multiplexed Dark Field Microspectrometry

 The SMMS technology has been developed by Valerio Pini et al.  With SMMS we get polarization-resolved spectral and spatial analysis of the scattered light over large surface areas. The SMMS technique provides three orders of magnitude faster spectroscopic analysis than conventional dark-field microspectrophotometry, with the capability for mapping the spatial distribution of the scattered light intensity with lateral resolution of 40 nm over surface areas of 0.02 mm2. We show polarization-resolved dark-field spectral analysis of hundreds of gold nanoparticles deposited on a silicon surface. The technique allows determining the effect of the substrate on the LSPR of single nanoparticles and dimers and their scattering patterns.

 Do not miss the video supplementary material!


 Scientific Reports 6, Article number: 22836 (2016)


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