SMMS-Spatially Multiplexed Dark Field Microspectrometry

 The SMMS technology has been developed by Valerio Pini et al.  With SMMS we get polarization-resolved spectral and spatial analysis of the scattered light over large surface areas. The SMMS technique provides three orders of magnitude faster spectroscopic analysis than conventional dark-field microspectrophotometry, with the capability for mapping the spatial distribution of the scattered light intensity with lateral resolution of 40 nm over surface areas of 0.02 mm2. We show polarization-resolved dark-field spectral analysis of hundreds of gold nanoparticles deposited on a silicon surface. The technique allows determining the effect of the substrate on the LSPR of single nanoparticles and dimers and their scattering patterns.

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 Scientific Reports 6, Article number: 22836 (2016)


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